SEARCH RESULTS for assignee:"APPLIED MATERIALS, INC." AND day:[2019-09-10T00:00:00Z TO 2019-09-10T23:59:59Z]

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(X0) 14248935: APPARATUS AND METHODS FOR LOW TEMPERATURE MEASUREMENT IN A WAFER PROCESSING SYSTEM

(A1) 20140330422: APPARATUS AND METHODS FOR LOW TEMPERATURE MEASUREMENT IN A WAFER PROCESSING SYSTEM

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(B2) 10409306: APPARATUS AND METHODS FOR LOW TEMPERATURE MEASUREMENT IN A WAFER PROCESSING SYSTEM

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(X0) 14297240: LIGHT PIPE WINDOW STRUCTURE FOR THERMAL CHAMBER APPLICATIONS AND PROCESSES

(A1) 20140376897: LIGHT PIPE WINDOW STRUCTURE FOR THERMAL CHAMBER APPLICATIONS AND PROCESSES

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(B2) 10410890: LIGHT PIPE WINDOW STRUCTURE FOR THERMAL CHAMBER APPLICATIONS AND PROCESSES

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(X0) 14338027: METHOD AND APPARATUS TO AUTOMATICALLY CREATE VIRTUAL SENSORS WITH TEMPLATES

(A1) 20140336966: METHOD AND APPARATUS TO AUTOMATICALLY CREATE VIRTUAL SENSORS WITH TEMPLATES

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(B2) 10409272: METHOD AND APPARATUS TO AUTOMATICALLY CREATE VIRTUAL SENSORS WITH TEMPLATES

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(X0) 14507780: ATOMIC LAYER DEPOSITION CHAMBER WITH THERMAL LID

(A1) 20160097119: ATOMIC LAYER DEPOSITION CHAMBER WITH THERMAL LID

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(B2) 10407771: ATOMIC LAYER DEPOSITION CHAMBER WITH THERMAL LID