SEARCH RESULTS for assignee:"taiwan semiconductor manufacturing company ltd"

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(X0) 15605329: MEMS DEVICE WITH ENHANCED SENSING STRUCTURE AND MANUFACTURING METHOD THEREOF

(A1) 20180339899: MEMS DEVICE WITH ENHANCED SENSING STRUCTURE AND MANUFACTURING METHOD THEREOF

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(X0) 15604700: CURRENT SENSOR CIRCUIT

(A1) 20180340964: CURRENT SENSOR CIRCUIT

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(X0) 15685220: SEMICONDUCTOR DEVICE INCLUDING POLYSILICON STRUCTURES AND METHOD OF FORMING THE SAME

(A1) 20180342417: SEMICONDUCTOR DEVICE INCLUDING POLYSILICON STRUCTURES AND METHOD OF FORMING THE SAME

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(X0) 15729307: SEMICONDUCTOR DEVICE INCLUDING TRIMMED-GATES AND METHOD FOR GENERATING LAYOUT OF SAME

(A1) 20180342523: SEMICONDUCTOR DEVICE INCLUDING TRIMMED-GATES AND METHOD FOR GENERATING LAYOUT OF SAME

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(X0) 15861128: INTEGRATED CIRCUIT AND METHOD FOR MANUFACTURING THE SAME

(A1) 20180341735: INTEGRATED CIRCUIT AND METHOD FOR MANUFACTURING THE SAME

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(X0) 15605450: SEMICONDUCTOR DEVICE PACKAGE AND METHOD OF MANUFACTURING THE SAME

(A1) 20180342466: SEMICONDUCTOR DEVICE PACKAGE AND METHOD OF MANUFACTURING THE SAME

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(X0) 15800991: TRANSCEIVING DEVICE

(A1) 20180343027: TRANSCEIVING DEVICE

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(X0) 15842498: INTERCONNECT STRUCTURE AND MANUFACTURING METHOD THEREOF

(A1) 20180342456: INTERCONNECT STRUCTURE AND MANUFACTURING METHOD THEREOF

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(X0) 15949804: SEMICONDUCTOR DEVICE, CORRESPONDING MASK AND METHOD FOR GENERATING LAYOUT OF SAME

(A1) 20180341736: SEMICONDUCTOR DEVICE, CORRESPONDING MASK AND METHOD FOR GENERATING LAYOUT OF SAME

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(X0) 16042391: PELLICLE FOR EUV MASK AND FABRICATION THEREOF

(A1) 20180341174: PELLICLE FOR EUV MASK AND FABRICATION THEREOF

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(X0) 15590348: SEMICONDUCTOR PACKAGE DEVICE WITH INTEGRATED ANTENNA AND MANUFACTURING METHOD THEREOF

(A1) 20180331041: SEMICONDUCTOR PACKAGE DEVICE WITH INTEGRATED ANTENNA AND MANUFACTURING METHOD THEREOF

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(X0) 15591640: PELLICLE AND METHOD OF USING THE SAME

(A1) 20180329288: PELLICLE AND METHOD OF USING THE SAME

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(X0) 15902880: MULTIPLEXER CIRCUIT, SEMICONDUCTOR DEVICE FOR MULTIPLEXING VOLTAGES, AND METHOD OF OPERATING SAME

(A1) 20180331683: MULTIPLEXER CIRCUIT, SEMICONDUCTOR DEVICE FOR MULTIPLEXING VOLTAGES, AND METHOD OF OPERATING SAME

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(X0) 16042063: Method and System for Overlay Control

(A1) 20180329313: Method and System for Overlay Control

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(X0) 15586599: PHOTOMASK AND FABRICATION METHOD THEREFOR

(A1) 20180321581: PHOTOMASK AND FABRICATION METHOD THEREFOR

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(X0) 16022680: SYSTEM FOR DESIGNING A SEMICONDUCTOR DEVICE, DEVICE MADE, AND METHOD OF USING THE SYSTEM

(A1) 20180323182: SYSTEM FOR DESIGNING A SEMICONDUCTOR DEVICE, DEVICE MADE, AND METHOD OF USING THE SYSTEM

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(X0) 16033401: Method for Forming Stacked Nanowire Transistors

(A1) 20180323065: Method for Forming Stacked Nanowire Transistors

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(X0) 16022687: OUTPUT RESISTANCE TESTING METHOD

(A1) 20180321291: OUTPUT RESISTANCE TESTING METHOD

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(X0) 14927822: Elongated Semiconductor Structure Planarization

(A1) 20170125518: Elongated Semiconductor Structure Planarization

(B2) 1: Elongated Semiconductor Structure Planarization

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(B2) 1: SEMICONDUCTOR DEVICE AND A METHOD FOR FABRICATING THE SAME

(X0) 15649909: SEMICONDUCTOR DEVICE AND A METHOD FOR FABRICATING THE SAME

(A1) 20180190504: SEMICONDUCTOR DEVICE AND A METHOD FOR FABRICATING THE SAME

(B2) 1: SEMICONDUCTOR DEVICE AND A METHOD FOR FABRICATING THE SAME