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(X0) 14569908: SEMICONDUCTOR APPARATUS AND TEST SYSTEM INCLUDING THE SAME

(A1) 20160087428: SEMICONDUCTOR APPARATUS AND TEST SYSTEM INCLUDING THE SAME

(B2) 1: SEMICONDUCTOR APPARATUS AND TEST SYSTEM INCLUDING THE SAME

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(X0) 14702449: REFERENCE VOLTAGE GENERATOR BEING TOLERANT OF TEMPERATURE VARIATION

(A1) 20160170432: REFERENCE VOLTAGE GENERATOR BEING TOLERANT OF TEMPERATURE VARIATION

(B2) 1: REFERENCE VOLTAGE GENERATOR BEING TOLERANT OF TEMPERATURE VARIATION

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(X0) 15096119: MEMORY SYSTEM AND OPERATING METHOD THEREOF USING SEGMENT LISTS

(A1) 20170139645: MEMORY SYSTEM AND OPERATING METHOD THEREOF USING SEGMENT LISTS

(B2) 1: MEMORY SYSTEM AND OPERATING METHOD THEREOF USING SEGMENT LISTS

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(X0) 15159421: DATA STORAGE DEVICE AND OPERATING METHOD THEREOF

(A1) 20170154657: DATA STORAGE DEVICE AND OPERATING METHOD THEREOF

(B2) 1: DATA STORAGE DEVICE AND OPERATING METHOD THEREOF

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(X0) 15294387: HETEROGENEOUS PACKAGE IN DIMM

(A1) 20170109077: HETEROGENEOUS PACKAGE IN DIMM

(B2) 1: HETEROGENEOUS PACKAGE IN DIMM

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(X0) 15486845: SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

(A1) 20180040629: SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

(B2) 1: SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

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(X0) 15614677: APPARATUS AND METHODS FOR GENERATING REFERENCE VOLTAGES FOR INPUT BUFFERS OF A MEMORY DEVICE

(A1) 20180130517: APPARATUS AND METHODS FOR GENERATING REFERENCE VOLTAGES FOR INPUT BUFFERS OF A MEMORY DEVICE

(B2) 1: APPARATUS AND METHODS FOR GENERATING REFERENCE VOLTAGES FOR INPUT BUFFERS OF A MEMORY DEVICE

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(X0) 15633275: MEMORY SYSTEM AND METHOD FOR ACCELERATING BOOT TIME

(A1) 20170371834: MEMORY SYSTEM AND METHOD FOR ACCELERATING BOOT TIME

(B2) 1: MEMORY SYSTEM AND METHOD FOR ACCELERATING BOOT TIME

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(X0) 15635600: SEMICONDUCTOR PACKAGES INCLUDING HEAT TRANSFERRING BLOCKS AND METHODS OF MANUFACTURING THE SAME

(A1) 20180175011: SEMICONDUCTOR PACKAGES INCLUDING HEAT TRANSFERRING BLOCKS AND METHODS OF MANUFACTURING THE SAME

(B2) 1: SEMICONDUCTOR PACKAGES INCLUDING HEAT TRANSFERRING BLOCKS AND METHODS OF MANUFACTURING THE SAME

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(X0) 15627562: SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF

(A1) 20180096731: SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF

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(X0) 15651117: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE

(A1) 20180174905: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE

(B2) 1: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE

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(X0) 15473237: MODIFIABLE STRIPE LENGTH IN FLASH MEMORY DEVICES

(A1) 20180046538: MODIFIABLE STRIPE LENGTH IN FLASH MEMORY DEVICES

(B2) 1: MODIFIABLE STRIPE LENGTH IN FLASH MEMORY DEVICES

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(X0) 15700539: MEMORY SYSTEM AND OPERATING METHOD THEREOF

(A1) 20180150225: MEMORY SYSTEM AND OPERATING METHOD THEREOF

(B2) 1: MEMORY SYSTEM AND OPERATING METHOD THEREOF

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(X0) 15817555: ANALOG-TO-DIGITAL CONVERTER (ADC) WITH IMPROVED POWER DISTURBANCE REDUCTION

(A1) 20180145698: ANALOG-TO-DIGITAL CONVERTER (ADC) WITH IMPROVED POWER DISTURBANCE REDUCTION

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(X0) 15854191: SEMICONDUCTOR DEVICE AND ERROR MANAGEMENT METHOD

(A1) 20180373594: SEMICONDUCTOR DEVICE AND ERROR MANAGEMENT METHOD

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(X0) 15859851: MEMORY DEVICE AND OPERATING METHOD THEREOF

(A1) 20180374555: MEMORY DEVICE AND OPERATING METHOD THEREOF

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(X0) 15860002: MEMORY SYSTEM AND OPERATING METHOD THEREOF

(A1) 20180373629: MEMORY SYSTEM AND OPERATING METHOD THEREOF

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(X0) 15861861: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

(A1) 20180374868: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

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