SEARCH RESULTS for assignee:"nikon"

Showing 1 to 20 of 114 results

Last Update Patent(s) Assignor(s) Orig. Assignee(s) Assignee(s) Reel/Frame
14-Jun-2018

(X0) 1: STRUCTURED ILLUMINATION MICROSCOPY SYSTEM, METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING PROGRAM

(A1) 2: STRUCTURED ILLUMINATION MICROSCOPY SYSTEM, METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING PROGRAM

NIKON CORPORATION

45068/348

12-Jun-2018

(X0) 1: SHUTTER DEVICE AND IMAGE-CAPTURING APPARATUS

(A1) 2: SHUTTER DEVICE AND IMAGE-CAPTURING APPARATUS

(B2) 9: SHUTTER DEVICE AND IMAGE-CAPTURING APPARATUS

HASUDA, MASANORI

OHASHI, KENJI

UEKI, TAKESHI

NIKON CORPORATION

43666/684

29-May-2018

(X0) 1: MEASUREMENT METHOD AND ENCODER DEVICE, AND EXPOSURE METHOD AND DEVICE

(A1) 2: MEASUREMENT METHOD AND ENCODER DEVICE, AND EXPOSURE METHOD AND DEVICE

(B2) 9: MEASUREMENT METHOD AND ENCODER DEVICE, AND EXPOSURE METHOD AND DEVICE

NIKON CORPORATION

34933/278

29-May-2018

(X0) 1: VARIABLE POWER OPTICAL ASSEMBLY, OPTICAL DEVICE, AND VARIABLE POWER OPTICAL ASSEMBLY FABRICATION METHOD

(A1) 2: VARIABLE POWER OPTICAL ASSEMBLY, OPTICAL DEVICE, AND VARIABLE POWER OPTICAL ASSEMBLY FABRICATION METHOD

(B2) 9: VARIABLE POWER OPTICAL ASSEMBLY, OPTICAL DEVICE, AND VARIABLE POWER OPTICAL ASSEMBLY FABRICATION METHOD

OBAMA, AKIHIKO

SASHIMA, TOMOYUKI

NIKON CORPORATION

35538/987

29-May-2018

(X0) 2: RIFLE SCOPE

(B1) D: RIFLE SCOPE

NIKON VISION CO., LTD.

40772/403

29-May-2018

(X0) 2: RIFLE SCOPE

(B1) D: RIFLE SCOPE

NIKON VISION CO., LTD.

40772/425

24-May-2018

(X0) 1: VARIABLE POWER OPTICAL SYSTEM, OPTICAL APPARATUS, AND VARIABLE POWER OPTICAL SYSTEM MANUFACTURING METHOD

(A1) 2: VARIABLE POWER OPTICAL SYSTEM, OPTICAL APPARATUS, AND VARIABLE POWER OPTICAL SYSTEM MANUFACTURING METHOD

UCHIDA, KENSUKE

OBAMA, AKIHIKO

YAMAMOTO, HIROSHI

MATSUO, TAKU

NIKON CORPORATION

44169/677

22-May-2018

(X0) 1: PRESSING APPARATUS, SUBSTRATE BONDING APPARATUS AND STACKED SUBSTRATE

(A1) 2: PRESSING APPARATUS, SUBSTRATE BONDING APPARATUS AND STACKED SUBSTRATE

(B2) 9: PRESSING APPARATUS, SUBSTRATE BONDING APPARATUS AND STACKED SUBSTRATE

IZUMI, SHIGETO

TAKAHASHI, SATOSHI

NIKON CORPORATION

33721/962

22-May-2018

(X0) 1: CORRECTION OF ERRORS CAUSED BY AMBIENT NON-UNIFORMITIES IN A FRINGE-PROJECTION AUTOFOCUS SYSTEM IN ABSENCE OF A REFERENCE MIRROR

(A1) 2: CORRECTION OF ERRORS CAUSED BY AMBIENT NON-UNIFORMITIES IN A FRINGE-PROJECTION AUTOFOCUS SYSTEM IN ABSENCE OF A REFERENCE MIRROR

(B2) 9: CORRECTION OF ERRORS CAUSED BY AMBIENT NON-UNIFORMITIES IN A FRINGE-PROJECTION AUTOFOCUS SYSTEM IN ABSENCE OF A REFERENCE MIRROR

GOODWIN, ERIC PETER

SMITH, DANIEL GENE

NIKON CORPORATION

34128/671

22-May-2018

(X0) 1: APPARATUS AND METHODS FOR MEASURING THERMALLY INDUCED RETICLE DISTORTION

(A1) 2: APPARATUS AND METHODS FOR MEASURING THERMALLY INDUCED RETICLE DISTORTION

(B2) 9: APPARATUS AND METHODS FOR MEASURING THERMALLY INDUCED RETICLE DISTORTION

NIKON CORPORATION

43300/311

17-May-2018

(X0) 1: VARIABLE POWER OPTICAL SYSTEM, OPTICAL APPARATUS, AND VARIABLE POWER OPTICAL SYSTEM MANUFACTURING METHOD

(A1) 2: VARIABLE POWER OPTICAL SYSTEM, OPTICAL APPARATUS, AND VARIABLE POWER OPTICAL SYSTEM MANUFACTURING METHOD

NIKON CORPORATION

44344/841

17-May-2018

(X0) 1: CHARGED PARTICLE BEAM EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD

(A1) 2: CHARGED PARTICLE BEAM EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD

NIKON CORPORATION

44456/817

17-May-2018

(X0) 1: ILLUMINATION DEVICE FOR OPTIMIZING POLARIZATION IN AN ILLUMINATION PUPIL

(A1) 2: ILLUMINATION DEVICE FOR OPTIMIZING POLARIZATION IN AN ILLUMINATION PUPIL

SMITH, DANIEL GENE

SOGARD, MICHAEL

NIKON CORPORATION

45817/693

10-May-2018

(X0) 1: MEASUREMENT DEVICE AND MEASUREMENT METHOD, EXPOSURE APPARATUS AND EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD

(A1) 2: MEASUREMENT DEVICE AND MEASUREMENT METHOD, EXPOSURE APPARATUS AND EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD

NIKON CORPORATION

43510/427

10-May-2018

(X0) 1: VARIABLE POWER OPTICAL SYSTEM, OPTICAL APPARATUS, AND VARIABLE POWER OPTICAL SYSTEM MANUFACTURING METHOD

(A1) 2: VARIABLE POWER OPTICAL SYSTEM, OPTICAL APPARATUS, AND VARIABLE POWER OPTICAL SYSTEM MANUFACTURING METHOD

YAMAMOTO, HIROSHI

MATSUO, TAKU

OBAMA, AKIHIKO

UCHIDA, KENSUKE

NIKON CORPORATION

44169/456

10-May-2018

(X0) 1: TRANSPARENT-BLOCK ENCODER HEAD WITH ISOTROPIC WEDGED ELEMENTS

(A1) 2: TRANSPARENT-BLOCK ENCODER HEAD WITH ISOTROPIC WEDGED ELEMENTS

NIKON CORPORATION

45137/639

03-May-2018

(X0) 1: MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT PROCESSING METHOD, MEASUREMENT PROCESSING PROGRAM, AND STRUCTURE MANUFACTURING METHOD

(A1) 2: MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT PROCESSING METHOD, MEASUREMENT PROCESSING PROGRAM, AND STRUCTURE MANUFACTURING METHOD

YASHIMA, HIROTOMO

HAYANO, FUMINORI

KAWAI, AKITOSHI

NIKON CORPORATION

44086/115

03-May-2018

(X0) 1: REFLECTIVE MIRROR, PROJECTION OPTICAL SYSTEM, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

(A1) 2: REFLECTIVE MIRROR, PROJECTION OPTICAL SYSTEM, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

KAWABE, YOSHIO

CHIBA, HIROSHI

NIKON CORPORATION

44517/1

01-May-2018

(X0) 2: BINOCULARS

(B1) D: BINOCULARS

NIKON VISION CO., LTD.

38929/959

01-May-2018

(X0) 1: ELECTRONIC DEVICE, IMAGING DEVICE, AND IMAGING ELEMENT

(A1) 2: ELECTRONIC DEVICE, IMAGING DEVICE, AND IMAGING ELEMENT

(B2) 9: ELECTRONIC DEVICE, IMAGING DEVICE, AND IMAGING ELEMENT

GOHARA, KOICHI

TSUCHIYA, SATOSHI

NIKON CORPORATION

40689/192