SEARCH RESULTS for assignee:"micron technology"

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(X0) 15445935: APPARATUSES AND METHODS FOR DETERMINING A PHASE RELATIONSHIP BETWEEN AN INPUT CLOCK SIGNAL AND A MULTIPHASE CLOCK SIGNAL

(A1) 20180247683: APPARATUSES AND METHODS FOR DETERMINING A PHASE RELATIONSHIP BETWEEN AN INPUT CLOCK SIGNAL AND A MULTIPHASE CLOCK SIGNAL

(B2) 1: APPARATUSES AND METHODS FOR DETERMINING A PHASE RELATIONSHIP BETWEEN AN INPUT CLOCK SIGNAL AND A MULTIPHASE CLOCK SIGNAL

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(X0) 15692003: APPARATUSES AND METHODS FOR PERFORMING LOGICAL OPERATIONS USING SENSING CIRCUITRY IN A MEMORY DEVICE

(A1) 20170365299: APPARATUSES AND METHODS FOR PERFORMING LOGICAL OPERATIONS USING SENSING CIRCUITRY IN A MEMORY DEVICE

(B2) 1: APPARATUSES AND METHODS FOR PERFORMING LOGICAL OPERATIONS USING SENSING CIRCUITRY IN A MEMORY DEVICE

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(X0) 15702225: MICROELECTRONIC DEVICES, STACKED MICROELECTRONIC DEVICES, AND METHODS FOR MANUFACTURING SUCH DEVICES

(A1) 20180005909: MICROELECTRONIC DEVICES, STACKED MICROELECTRONIC DEVICES, AND METHODS FOR MANUFACTURING SUCH DEVICES

(B2) 1: MICROELECTRONIC DEVICES, STACKED MICROELECTRONIC DEVICES, AND METHODS FOR MANUFACTURING SUCH DEVICES

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(X0) 15832431: INPUT BUFFER CIRCUIT

(B1) 1: INPUT BUFFER CIRCUIT

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(X0) 15849052: ELECTRONIC DEVICE WITH AN OUTPUT VOLTAGE BOOSTER MECHANISM

(B1) 1: ELECTRONIC DEVICE WITH AN OUTPUT VOLTAGE BOOSTER MECHANISM

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(X0) 15962886: APPARATUSES AND METHODS FOR REFRESHING MEMORY CELLS OF A SEMICONDUCTOR DEVICE

(A1) 20180240511: APPARATUSES AND METHODS FOR REFRESHING MEMORY CELLS OF A SEMICONDUCTOR DEVICE

(B2) 1: APPARATUSES AND METHODS FOR REFRESHING MEMORY CELLS OF A SEMICONDUCTOR DEVICE

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(X0) 16022444: ELECTRONIC DEVICE WITH A CHARGING MECHANISM

(B1) 1: ELECTRONIC DEVICE WITH A CHARGING MECHANISM

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(X0) 15671774: REPLACEABLE MEMORY

(A1) 20190050305: REPLACEABLE MEMORY

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(X0) 15671895: Polishing Apparatuses

(A1) 20190047109: Polishing Apparatuses

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(X0) 15672423: SECURING A MEMORY CARD

(A1) 20190050703: SECURING A MEMORY CARD

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(X0) 15674850: METHODS AND SYSTEM FOR PROCESSING SEMICONDUCTOR DEVICE STRUCTURES

(A1) 20190051630: METHODS AND SYSTEM FOR PROCESSING SEMICONDUCTOR DEVICE STRUCTURES

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(X0) 15674178: SHARED ADDRESS COUNTERS FOR MULTIPLE MODES OF OPERATION IN A MEMORY DEVICE

(A1) 20190050284: SHARED ADDRESS COUNTERS FOR MULTIPLE MODES OF OPERATION IN A MEMORY DEVICE

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(X0) 15675223: CHARGE TRAP STRUCTURE WITH BARRIER TO BLOCKING REGION

(A1) 20190051661: CHARGE TRAP STRUCTURE WITH BARRIER TO BLOCKING REGION

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(X0) 15675265: VOID FORMATION IN CHARGE TRAP STRUCTURES

(A1) 20190051656: VOID FORMATION IN CHARGE TRAP STRUCTURES

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(X0) 15675197: VOID FORMATION FOR CHARGE TRAP STRUCTURES

(A1) 20190051660: VOID FORMATION FOR CHARGE TRAP STRUCTURES

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(X0) 15982129: SEMICONDUCTOR DEVICES HAVING DISCRETELY LOCATED PASSIVATION MATERIAL, AND ASSOCIATED SYSTEMS AND METHODS

(A1) 20190051623: SEMICONDUCTOR DEVICES HAVING DISCRETELY LOCATED PASSIVATION MATERIAL, AND ASSOCIATED SYSTEMS AND METHODS

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(X0) 16138256: APPARATUSES AND METHODS FOR READING MEMORY CELLS

(A1) 20190051657: APPARATUSES AND METHODS FOR READING MEMORY CELLS

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(X0) 16158353: MEMORY CELLS HAVING A PLURALITY OF RESISTANCE VARIABLE MATERIALS

(A1) 20190051350: MEMORY CELLS HAVING A PLURALITY OF RESISTANCE VARIABLE MATERIALS